Accuracy
uSense transforms inspection
uSense is an all-in-one raster-scan submillimeter 3D imaging system designed specifically for scientific applications. It offers unique features and remarkable performance, enabling volumetric control of the structural integrity of any dielectric object.
Highly versatile, uSense can be adapted to numerous studies: detection of cracks, delamination, metallic or wet foreign bodies, extraction of permittivity, optical indices, and even provide density information.
uSense, the world first fully integrated millimeter imaging station for labs
| Parameter | Symbol | Min. | Typ. | Max. | Unit | Comment |
|---|---|---|---|---|---|---|
| Scanning length | Lscan | - | - | 595 | mm | - |
| Scanning width | Lscan | - | - | 295 | mm | - |
| Acquisition rate | facq | 32 | - | 64 | Hz | - |
| Lengthwise resolution | RXY | 0.1 | 1 | 10 | mm | - |
| Depth resolution | RZ | 1 | 7 | - | mm | Typ. measured on the 120 GHz chip. |
| Parameter | Symbol | Min. | Typ. | Max. | Unit | Comment |
|---|---|---|---|---|---|---|
| Length | L | - | - | 1.15 | m | - |
| Width | W | - | - | 0.6 | m | - |
| Height | H | - | - | 0.7 | m | - |
| Weight | m | - | - | 40 | kg | - |
| Parameter | Symbol | Min. | Typ. | Max. | Unit | Comment |
|---|---|---|---|---|---|---|
| Grid voltage | Veff | 100 | 230 | 240 | V | uSense is compatible will all different types of electrical grids around the world |
| Grid frequency | fgrid | 50 | 50 | 60 | Hz | |
| Power draw | Pin | - | 49 | 305 | W | Including optional tablet. May be lower in practice. |
| Battery life | tbatt | - | 9 | 16 | h | Battery life only applies to the optional tablet |
application
Non intrusive imaging
See beyond surfaces with fast, high-resolution, non-destructive imaging.
Modular millimeter-wave imaging station
- High-resolution, depth-resolved inspection of non-conductive materials
- Multi-frequency operation (from millimeter to submillimeter waves)
- Volumetric and time-resolved probing of internal structures
- Motorized scanning for precise, repeatable measurements
- Designed for R&D, advanced inspection studies, and feasibility assessments
Typical uses: material characterization, defect analysis, inspection method development.
Application Notes
FAQ
What are the technical specifications of your equipment?
Optikan sells a variety of different products with different technical specifications depending on our customers’ needs. However, they typically share the same core technology which is based on FMCW radars operating at frequency ranging from 57 GHz to 328.5 GHz; The main characteristics of these products are:
- An average emitted optical power up to 5 dBm or ~3 mW per radar chip;
- A typical digital resolution of 1 mm;
- An acquisition rate between 60 Hz and 3000 Hz.
For more information, the complete technical datasheet for each of our products is available for free to download on their respective page.
Is calibration required before use?
As with any measurement device, calibration is necessary before use. However, depending on the device, the process may differ:
- On the uSense and uSkan, no calibration is necessary, as they are automatically performed on the reference plate prior to any scan;
- On the uSense LITE, calibration must be performed manually after turning it on.
-
Please note: due to thermal equilibrium delay, it is recommended to wait 15 minutes after turning the device on before doing the calibration and using it for measurements.
What hardware or software requirements are needed?
A computer or tactile tablet is required to monitor each of our devices, which may be provided by Optikan as an option. Depending on the device, either a USB-C port of Ethernet port with Gigabit Ethernet capability is required.
Our software is currently available for Windows 11 machines on all our devices, although certain Linux distributions may be supported on the uSkan.
For more information, please check out the technical datasheet of each product on their respective page.
Need more informations ?
Contact our team to discuss about your specific needs
results
Key Figures
uSense improves quality and reduces costs. The data shows a significant increase in defect detection.
Ultra-wideband coverage
57.4 – 328.5 GHz
Multi-band radar imaging for advanced material characterization using
4,independent radar heads.
Fast laboratory imaging
70 Hz
Radar heads operating at up to 70 Hz, enabling full scan coverage in minutes.
Imaging Batch
2 acquisition modes
Switch between high-resolution imaging of a single sample and batch monitoring of multiple samples over time.
Specular & Scattering
2 reflection modes
Toggle between specular reflection imaging and scattering-based inspection for complementary material analysis.
Meet uSense, uSense lite, uSkan and more
Arval Software – Industrial analysis and co-pilotingsolution
Software platform designed to analyze, monitor, and co-pilot inspection systems in lab and production environments.
uFrame – High-speed multi-sensorinspection module
Modular inspection frame embedding 12 juxtaposed sensors, designed for very high-speed, inline and embedded inspection architectures
uCore
Compact high-cadence sensing module designed for advanced OEM integration and specialized inspection systems.
uSkan – Conveyor-ready inspection platform
For high-speed on-line applications
uSense Lite – Handheld measurement device
For on-site inspection, maintenance, and reparation